Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

Author

Kim, Woopoung ; Lee, Seock Hee ; Swaminathan, Madhavan ; Tummala, Rao R.

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2001

fDate

2001

Firstpage

113

Lastpage

116

Abstract

This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortline calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology

Keywords

calibration; electric impedance measurement; high-frequency transmission line measurement; multichip modules; printed circuits; time-domain reflectometry; MCM-L technology; calibration; frequency-dependent characteristic impedance; one-port measurement; parameter extraction; printed wiring board; time domain reflectometry; transmission line; Calibration; Frequency dependence; Frequency measurement; Impedance measurement; Reflectometry; Robustness; Thickness measurement; Time measurement; Transmission line measurements; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2001

Conference_Location

Cambridge, MA

Print_ISBN

0-7803-7024-4

Type

conf

DOI

10.1109/EPEP.2001.967624

Filename

967624