• DocumentCode
    1937497
  • Title

    Analysis of single-trial EEG data using a combined robust pre-whitening technique and ICA approach

  • Author

    Zhao, Liungyu ; Cao, Jianting ; Hoya, Tetsuya ; Cichocki, Andrzej

  • Author_Institution
    Graduate Sch. of Eng., Saitama Inst. of Technol., Japan
  • fYear
    2005
  • fDate
    28-30 May 2005
  • Firstpage
    238
  • Lastpage
    242
  • Abstract
    In electroencephalograph (EEG) experiment, the measure result are usually influenced by different kinds of noise with high power. Treating an averaged event-related potential (ERP) data is a main approach in recent topics of applying independent component analysis (ICA) to EEG signal processing. By taking the average, the signal-noise ratio (SNR) is increased, however, some important information such as the trial-by-trial variation of the amplitude is lost during the averaging. On the other hand, the analysis of single-trial data is generally hard in the low SNR. This paper presents a robust pre-whitening technique with ICA approach for the unaveraged single-trial EEG data. Our approach is based upon the two techniques: decorrelation with a high-level additive noise reduction and decomposition of individual source components. The results on the unaveraged visual evoked potential (VEP) single-trial data analysis illustrate that not only the behavior and location but also the activity strength (amplitude) and dynamics of the individual evoked response can be visualized by the proposed method.
  • Keywords
    AWGN; decorrelation; electroencephalography; independent component analysis; medical signal processing; signal denoising; ICA approach; additive noise decomposition; additive noise reduction; electroencephalograph; event-related potential data; independent component analysis; pre-whitening technique; signal decorrelation; signal-noise ratio; single-trial EEG data; visual evoked potential; Data analysis; Decorrelation; Electroencephalography; Enterprise resource planning; Independent component analysis; Noise measurement; Noise robustness; Power measurement; Signal processing; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and Video Technology, 2005. Proceedings of 2005 IEEE International Workshop on
  • Print_ISBN
    0-7803-9005-9
  • Type

    conf

  • DOI
    10.1109/IWVDVT.2005.1504595
  • Filename
    1504595