• DocumentCode
    1937578
  • Title

    The pretreatment of aluminum bondpads for electroless nickel bumping

  • Author

    Ostmann, A. ; Simon, J. ; Reichl, H.

  • Author_Institution
    Tech. Univ. Berlin, Germany
  • fYear
    1993
  • fDate
    15-18 Mar 1993
  • Firstpage
    74
  • Lastpage
    78
  • Abstract
    Electroless nickel bumping is a low cost approach to bumping. This method can also be used to convert the aluminum bondpad to a solderable surface (Ni/Au) for flip-chip application. In this study, Ni/P-bumps were produced by electroless nickel plating on different samples. For the pretreatment of aluminum bondpads, a commercial zincate solution was modified. The shear strength and the electrical resistance were investigated for different initial states of aluminum bondpads. It is shown that residues on the aluminum from the semiconductor fabrication can cause an increase in the electrical resistance and a decrease in shear strength. On clean aluminum bondpads, bumps with a shear strength of 180 cN and an electrical resistance below 1 mΩ have been achieved. Thermal cycling shows no significant decrease in the shear strength
  • Keywords
    aluminium; electroless deposition; flip-chip devices; microassembling; multichip modules; nickel; shear strength; surface treatment; Al bondpads pretreatment; MCM; Ni; Ni-Au surface; NiP; annealing; electrical resistance; electroless bumping process; electroless plating; flip-chip application; semiconductor fabrication; shear strength; thermal cycling; Aluminum; Bonding; Copper; Costs; Electric resistance; Gold; Nickel; Substrates; Surface cleaning; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multi-Chip Module Conference, 1993. MCMC-93, Proceedings., 1993 IEEE
  • Conference_Location
    Santa Cruz, CA
  • Print_ISBN
    0-8186-3540-1
  • Type

    conf

  • DOI
    10.1109/MCMC.1993.302148
  • Filename
    302148