Title :
Characterization of thin film organic materials at high frequency
Author :
Dalmia, Sidharth ; Hobbs, Joseph M. ; Sundaram, Venky ; Swaminathan, Madhavan ; White, George E. ; Tummala, Rao R. ; Ogitani, S.
Author_Institution :
Delphi Packard Electr. Syst., Warren, OH, USA
Abstract :
By considering the potential variation of process parameters such as line width and dielectric thickness, several hybrid coplanar waveguide microstrip (CPWM) well matched lines were designed, fabricated and tested up to 6 GHz on a low loss thin film organic high density interconnect (HDI) substrate. The multiple CPWM lines were then used to characterize the thin film dielectric up to 6 GHz
Keywords :
coplanar waveguides; dielectric measurement; dielectric thin films; microstrip lines; microwave measurement; organic compounds; substrates; 6 GHz; dielectric thickness; high density interconnect substrate; high frequency measurement; hybrid coplanar waveguide microstrip line; line width; thin film organic material; Automotive engineering; Costs; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Dielectric thin films; Frequency measurement; Organic materials; Transistors;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967629
