DocumentCode
1937689
Title
High density overlay interconnect (HDI) delivers high frequency performance for GaAs systems
Author
Gdula, Michael ; Haller, Theodore ; Krishnamurthy, Vikram ; Forman, Glenn
Author_Institution
GE Corp. Res. & Dev. Center, Schenectady, NY, USA
fYear
1993
fDate
15-18 Mar 1993
Firstpage
33
Lastpage
38
Abstract
The authors point out that large die size, high gate and transistor count digital GaAs devices present problems to the system designer, such as efficient distribution of low voltage, high current power supply bias (2 VDC at 25 A, and greater). The effective delivery of such electrical power must also allow for efficient removal of the heat generated by the electronics circuits. By exploiting appropriate MCM technology, these thermal concerns are satisfied while eliminating to a maximum extent conventional circuit packaging parasitics which limit performance of high frequency systems. The overlay interconnect MCM approach used by GE/TI places IC chips first, into a structure for the most advantageous thermal management, while eliminating conventional packaging resistance, inductance and capacitance effects. Several designs constructed with overlay interconnect demonstrate the highest frequency operation and thermal performance of MCMs to date. System designs with 400 MHz and greater clock operation and dissipating 50 W are described
Keywords
III-V semiconductors; gallium arsenide; integrated circuit technology; logic arrays; multichip modules; thermal analysis; 2 V; 25 A; 400 MHz; 50 W; GaAs digital devices; IC chips; MCM technology; capacitance effects; circuit packaging parasitics; clock operation; crosspoint switch MCM; die size; gate array circuits; high density interconnect; high frequency systems; inductance effect; overlay interconnect MCM approach; packaging resistance; semiconductor; thermal management; Current supplies; Electronic packaging thermal management; Frequency; Gallium arsenide; Integrated circuit interconnections; Low voltage; Power supplies; Power system interconnection; Thermal management; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Multi-Chip Module Conference, 1993. MCMC-93, Proceedings., 1993 IEEE
Conference_Location
Santa Cruz, CA
Print_ISBN
0-8186-3540-1
Type
conf
DOI
10.1109/MCMC.1993.302156
Filename
302156
Link To Document