Title :
Design and performance evaluation of overcurrent protection schemes for silicon carbide (SiC) power MOSFETs
Author :
Zhiqiang Wang ; Xiaojie Shi ; Yang Xue ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Wang, F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
Overcurrent protection of silicon carbide (SiC) MOSFETs remains a challenge due to lack of practical knowledge. This paper presents two overcurrent protection methods to improve the reliability and overall cost of the SiC MOSFET based converter. First, a solid state circuit breaker (SSCB) composed primarily by a Si IGBT and a commercial gate driver IC is connected in series with the DC bus to detect and clear overcurrent faults. Second, the desaturation technique using a sensing diode to detect the drain-source voltage under overcurrent faults is implemented as well. The design considerations and potential issues of the protection methods are described and analyzed in detail. A phase-leg configuration based step-down converter is built to evaluate the performance of the proposed protection schemes under various conditions, considering variation of fault type, decoupling capacitance, protection circuit parameters, etc. Finally, a comparison is made in terms of fault response time, temperature dependent characteristics, and applications to help designers select a proper protection method.
Keywords :
MOSFET; circuit breakers; driver circuits; overcurrent protection; power convertors; power transistors; silicon compounds; DC bus; IGBT; SSCB; SiC; commercial gate driver IC; decoupling capacitance; desaturation technique; drain-source voltage; fault response time; overcurrent faults; overcurrent protection schemes; performance evaluation; phase-leg configuration-based step-down converter; power MOSFET; protection circuit parameters; sensing diode; solid state circuit breaker; temperature dependent characteristics; Capacitance; Capacitors; Circuit faults; Insulated gate bipolar transistors; Logic gates; MOSFET; Silicon carbide;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE
Conference_Location :
Denver, CO
DOI :
10.1109/ECCE.2013.6647436