• DocumentCode
    1937828
  • Title

    A four-valued logic and switch-level differences

  • Author

    Hu, Mou

  • Author_Institution
    Dept. of Comput. Eng., Shanghai Inst. of Railway Technol., China
  • fYear
    1994
  • fDate
    25-27 May 1994
  • Firstpage
    362
  • Lastpage
    367
  • Abstract
    In this paper, the application of a four-valued logic to the switch-level test generation is studied. A switch-level operator fault model is proposed. Switch-level U difference and Z difference of a function to a fault are defined. A method to derive switch-level differences is given. Finally, a new switch-level test generation algorithm for CMOS circuits is presented
  • Keywords
    logic testing; many-valued logics; CMOS circuits; four-valued logic; operator fault model; switch-level; switch-level differences; switch-level test generation; test generation; Algebra; CMOS logic circuits; Circuit faults; Circuit testing; Logic circuits; Logic functions; Logic testing; MOSFETs; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multiple-Valued Logic, 1994. Proceedings., Twenty-Fourth International Symposium on
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-8186-5650-6
  • Type

    conf

  • DOI
    10.1109/ISMVL.1994.302177
  • Filename
    302177
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1937828