DocumentCode :
1937950
Title :
A highly manufacturable 0.2 /spl mu/m AlGaAs/InGaAs PHEMT fabricated using the single-layer integrated-metal FET (SLIMFET) process
Author :
Havasy, C.K. ; Quach, T.K. ; Bozada, C.A. ; DeSalvo, G.C. ; Dettmer, R.W. ; Ebel, J.L. ; Gillespie, J.K. ; Nakano, K. ; Via, G.D.
Author_Institution :
Wright Res. & Dev. Center, Wright-Patterson AFB, OH, USA
fYear :
1995
fDate :
Oct. 29 1995-Nov. 1 1995
Firstpage :
89
Lastpage :
92
Abstract :
This work is the development of a single-layer integrated-metal field effect transistor (SLIMFET) process for a high performance 0.2 /spl mu/m AlGaAs/InGaAs pseudomorphic high electron mobility transistor (PHEMT). This process is compatible with MMIC fabrication and minimizes process variations, cycle time, and cost. This process uses non-alloyed ohmic contacts, a selective gate-recess etching process, and a single gate/source/drain metal deposition step to form both Schottky and ohmic contacts at the same time.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device metallisation; semiconductor technology; 0.2 micron; AlGaAs-InGaAs; PHEMT; SLIMFET process; Schottky contacts; cost; cycle time; fabrication; nonalloyed ohmic contacts; process variations; pseudomorphic high electron mobility transistor; selective gate-recess etching; single gate/source/drain metal deposition; single-layer integrated-metal field effect transistor; Electron mobility; FETs; Fabrication; Field effect MMICs; HEMTs; Indium gallium arsenide; MODFETs; Manufacturing; Ohmic contacts; PHEMTs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1995. Technical Digest 1995., 17th Annual IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-2966-X
Type :
conf
DOI :
10.1109/GAAS.1995.528968
Filename :
528968
Link To Document :
بازگشت