Title :
An approach to measuring power supply impedance of microprocessors
Author :
Taylor, Greg ; Deutschle, Craig ; Arabi, Tawfik ; Owens, Brian
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
A technique to calculate the relative on die power supply impedance of high power CMOS integrated circuits as a function of frequency is described. This approach uses the power supply current variation that is normally present in a microprocessor to stimulate the supply network, varying the clock rate of the processor in order to obtain multiple measurements. Using this technique the power supply impedance vs. frequency of a 0.18 μm microprocessor was measured and compared to a simple lumped circuit model
Keywords :
CMOS digital integrated circuits; electric impedance measurement; integrated circuit measurement; microprocessor chips; power integrated circuits; power supply circuits; 0.18 micron; die power supply impedance measurement; frequency dependence; high power CMOS integrated circuit; lumped circuit model; microprocessor; CMOS integrated circuits; Clocks; Current measurement; Current supplies; Frequency; Impedance measurement; Integrated circuit measurements; Microprocessors; Power measurement; Power supplies;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2001
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-7024-4
DOI :
10.1109/EPEP.2001.967648
