DocumentCode :
1938192
Title :
800 K gates of random logic in four months: discussion on design methodologies based on “IDEFIX” ASIC experience
Author :
Gastaldello, S. ; Traverso, Giovanni ; Käse, R.
fYear :
1998
fDate :
13-16 Sep 1998
Firstpage :
187
Lastpage :
191
Abstract :
Reusability of basic building blocks is an important and effective goal in ASIC design: it speeds up the design, it minimizes the overall bug probability, it eases documentation and maintenance of core functions. Nevertheless, this approach means also a “black box” management, requiring some extra efforts in the implementation phase. Alcatel and Toshiba proved a solution to cope with the lack of knowledge and control of re-used blocks. This methodology seems to be effective, especially for million gates designs in deep submicron technologies. This paper discusses a real ASIC design case, where classical issues were combined: tough schedule; large glue logic (800 K netlist gates), with high connectivity; many clock domains (65 clocks), with many interactions; 50% reuse of old building blocks, many from netlist. The proposed flow improves by shortening design time, achieving high synthesis efficiency without usage of time consuming CRWC methodology, achieving high layout efficiency bypassing time consuming (and sometimes misleading) floorplanning /hierarchical methodologies
Keywords :
VLSI; application specific integrated circuits; circuit CAD; clocks; design for testability; integrated circuit design; logic CAD; ASIC experience; Alcatel; IDEFIX; Toshiba; clock domains; connectivity; core functions; deep submicron technologies; glue logic; layout efficiency; overall bug probability; random logic; synthesis efficiency; Application specific integrated circuits; Automatic test pattern generation; Buildings; Circuit synthesis; Clocks; Design methodology; Hardware design languages; Logic design; Logic gates; Research and development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC Conference 1998. Proceedings. Eleventh Annual IEEE International
Conference_Location :
Rochester, NY
ISSN :
1063-0988
Print_ISBN :
0-7803-4980-6
Type :
conf
DOI :
10.1109/ASIC.1998.722894
Filename :
722894
Link To Document :
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