Title :
A Novel Approach to Realistic Worst-case Simulations of CMOS Circuits
Author :
Bolt, M.J.B. ; Engel, J. ; Rocchi, M. ; van Steenwijk, A.
Author_Institution :
Philips Research Laboratories, P.O. Box 80000, 5600JA Eindhoven, The Netherlands
Abstract :
To enhance the design of CMOS circuits a new method, named Gradient Analysis, has been proposed and verified. Gradient Analysis enables designers to realistically predict the standard deviation of the circuit performance from measured or guesstimated device parameter variations. It is realistic both in terms of its accuracy and in terms of the number of simulation runs required. With as few as one simulation run the approach is shown to accurately predict the variation of 64K SRAMs Read Access Time and Low Level Output Voltage. Gradient Analysis also provides designers with information on the sensitivity of the circuit performance variations to the device parameter variations.
Keywords :
Analytical models; CMOS process; Capacitance measurement; Circuit optimization; Circuit simulation; Information analysis; Measurement standards; Performance analysis; Predictive models; Standards development;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany