Title :
X-Gen: a random test-case generator for systems and SoCs
Author :
Emek, Roy ; Jaeger, Itai ; Naveh, Yehuda ; Bergman, Gadi ; Aloni, Guy ; Katz, Yoav ; Farkash, Monica ; Dozoretz, Igor ; Goldin, Alex
Author_Institution :
Res. Lab., IBM Corp., Haifa, Israel
Abstract :
We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoC). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. X-Gen is currently in preliminary use at IBM for the verification of two different designs - a high-end multi-processor server and a state-of-the-art SoC.
Keywords :
automatic test pattern generation; embedded systems; formal verification; logic testing; system-on-chip; SoC; X-Gen; address translation mechanisms; component types; configuration; interactions; memories; model-based test-case generator; random test-case generator; registers; system model; systems on a chip; verification; Assembly systems; Concrete; Engines; Graphical user interfaces; Hardware; Heart; Laboratories; Registers; System testing; System-on-a-chip;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2002. Seventh IEEE International
Print_ISBN :
0-7803-7655-2
DOI :
10.1109/HLDVT.2002.1224444