• DocumentCode
    1938644
  • Title

    Fast Sampling of Implicit Surfaces by Particle Systems

  • Author

    Levet, Florian ; Granier, Xavier ; Schlick, Christophe

  • Author_Institution
    LaBRI-INRIA, Bordeaux I Univ.
  • fYear
    2006
  • fDate
    14-16 June 2006
  • Firstpage
    39
  • Lastpage
    39
  • Abstract
    Particle systems, as originally proposed by Witkin and Heckbert, are a powerful way to sample implicit surfaces since they generate almost evenly distributed samples over the surface, thanks to a global minimization of an energy criterion. Nonetheless, due to the computational cost of the relaxation process, the sampling process becomes rather expensive when the number of samples exceeds a few thousands. In this paper, we propose a technique that only relies on a pure geometry processing which enables us to rapidly generate the set of final particles (e.g., half a second to generate 5,000 particles for an analytic implicit surface) with near-optimal positions. Because of its characteristics, the technique does not need the usual split-and-death criterion any more and only about ten relaxation steps are necessary to get a high quality sampling. Either uniform or non-uniform sampling can be performed with our technique
  • Keywords
    computational geometry; image sampling; relaxation theory; surface fitting; distributed samples; fast sampling technique; geometry processing; global minimization; particle systems; relaxation process; split-and-death criterion; Anisotropic magnetoresistance; Computational efficiency; Convergence; Distributed power generation; Geometry; Power generation; Power system modeling; Sampling methods; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Shape Modeling and Applications, 2006. SMI 2006. IEEE International Conference on
  • Conference_Location
    Matsushima
  • Print_ISBN
    0-7695-2591-1
  • Type

    conf

  • DOI
    10.1109/SMI.2006.13
  • Filename
    1631216