Accurate closed-form expressions for the frequency-dependent line parameters of coupled on-chip interconnects on silicon substrate

Author

Lan, Hai ; Luoh, Amy ; Weisshaar, Andreas

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

fYear

2001

fDate

2001

Firstpage

335

Lastpage

338

Abstract

Accurate closed-form expressions for the frequency-dependent [R], [L], [G], [C] line parameters of coupled on-chip interconnects on lossy silicon substrate are presented. The closed-form expressions for the frequency-dependent series impedance parameters are obtained using a complex image method. The frequency-dependent shunt admittance parameters are expressed using high- and low-frequency asymptotic static solutions. The proposed closed-from expressions are shown to be in good agreement with both quasi-static and full-wave electromagnetic solutions

Keywords

elemental semiconductors; integrated circuit interconnections; integrated circuit modelling; silicon; Si; asymptotic static solution; closed-form expression; complex image method; coupled on-chip interconnects; frequency-dependent line parameters; lossy silicon substrate; series impedance; shunt admittance; Admittance; Closed-form solution; Conductivity; Design automation; Eddy currents; Frequency; Impedance; Integrated circuit interconnections; Microstrip; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 2001

Conference_Location

Cambridge, MA

Print_ISBN

0-7803-7024-4

Type

conf

DOI

10.1109/EPEP.2001.967676

Filename

967676