DocumentCode :
1939956
Title :
Kilometre-range, high resolution depth imaging using 1560 nm wavelength single-photon detection
Author :
McCarthy, Aongus ; Krichel, Nils J. ; Gemmell, Nathan R. ; Ximing Ren ; Tanner, Michael G. ; Dorenbos, Sander N. ; Zwiller, Val ; Hadfield, Robert Hugh ; Buller, Gerald S.
Author_Institution :
Sch. of Eng. & Phys. Sci., Scottish Univ. Phys. Alliance (SUPA), Edinburgh, UK
fYear :
2013
fDate :
12-16 May 2013
Firstpage :
1
Lastpage :
1
Abstract :
Single-photon time-of-flight ranging offers shot-noise limited detection and excellent surface-to-surface resolution. Infrared operation is advantageous in terms of improved eye safety and reduced solar background. Despite a number of recent advances in semiconductor infrared single photon detectors [1] little is available in the open literature in terms of long-range single-photon depth imaging. Previously, superconducting nanowire single photon detectors were used for ranging [2] from cooperative targets, however, we present recent depth imaging measurements using a state-of-the-art scanning time-of-flight system which has made measurements on non-cooperative targets in bright daylight conditions. This system was based on time-correlated single-photon counting (TCSPC), employing a 1560 nm source (50 MHz mode-locked fibre laser with a pulse width of <;1 ps) and a superconducting nanowire single-photon detector (SNSPD). We employed a niobium titanium nitride SNSPD on an oxidized silicon substrate, which formed a resonant optical cavity to achieve improved detection efficiency at telecom wavelengths [3]. The SNSPD was coupled using single-mode telecommunications optical fibre (9 μm diameter core) and mounted inside a closed-cycle refrigerator at an operating temperature of ~3 K [4]. Output pulses from the SNSPD were amplified at room temperature and routed to the TCSPC module. The SNSPD system detection efficiency is 17.5% at a wavelength of 1560 nm when biased for 1 kHz dark count rate. The overall system timing jitter was ~100 ps full-width at-half-maximum (FWHM). Depth profiling measurements were successfully performed under bright daylight conditions on a variety of targets. Field trial results are shown in Fig. 1. Uniquely, the performance of the system enabled a 1 mrad field-of-view depth profile movie of a moving object to be recorded at a standoff distance of 325 meters using a pixel dwell time of 1 ms. We will present the centimetre resolution d- pth profile movie, which was captured at 10 frames per second, each frame having 10 × 10 pixels.
Keywords :
cavity resonators; fibre lasers; fibre optic sensors; infrared detectors; infrared imaging; laser mode locking; measurement by laser beam; nanophotonics; nanowires; niobium compounds; photodetectors; photon counting; silicon; time of flight spectra; FWHM; NbTiN; SNSPD system detection efficiency; TCSPC module; bright daylight conditions; centimetre resolution depth profile movie; closed-cycle refrigerator; depth imaging measurement; depth profiling measurement; distance 325 m; field trial; field-of-view depth profile movie; frequency 50 MHz; full-width at-half-maximum; high resolution depth imaging; improved detection efficiency; improved eye safety; infrared operation; kilometre-range imaging; long-range single-photon depth imaging; mode-locked fibre laser; moving object; niobium titanium nitride SNSPD; noncooperative targets; operating temperature; output pulses; overall system timing jitter; oxidized silicon substrate; pixel dwell time; pulse width; reduced solar background; resonant optical cavity; scanning time-of-flight system; semiconductor infrared single photon detectors; shot-noise limited detection; single-mode telecommunication optical fibre; single-photon time-of-flight ranging; size 9 mum; standoff distance; superconducting nanowire single photon detectors; surface-to-surface resolution; system performance; telecom wavelength; temperature 293 K to 298 K; time 1 ms; time-correlated single-photon counting; wavelength 1560 nm; Detectors; Distance measurement; Educational institutions; Imaging; Photonics; Semiconductor device measurement; Telecommunications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
Type :
conf
DOI :
10.1109/CLEOE-IQEC.2013.6801943
Filename :
6801943
Link To Document :
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