Title :
Radiation effects studies on thin film TiO2 memristor devices
Author :
DeIonno, Erica ; Looper, Mark D. ; Osborn, Jon V. ; Barnaby, Hugh J. ; Tong, William M.
Author_Institution :
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245, USA
Abstract :
Memristor devices have been identified as potential replacements for a variety of memory applications and may also be suitable for space applications. In this work, we present a review of radiation testing on TiO2-based memristor devices. The experimental results from three previous studies are reviewed and coupled here with modeling to gain a more complete understanding of the energy deposition and resulting effects on the electrical performance of the device. In addition, we discuss the implications of having a nanometer scaled thin film device and how that affects the energy deposition from the various radiation sources.
Keywords :
Alpha particles; Bismuth; Ions; Neutrons; Protons; Radiation effects; Resistance;
Conference_Titel :
Aerospace Conference, 2013 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
978-1-4673-1812-9
DOI :
10.1109/AERO.2013.6497378