Title :
Transmitter mask testing for 28 GBaud PM-QPSK
Author :
Eliasson, Henrik ; Johannisson, Pontus ; Sunnerud, Henrik ; Westlund, Mathias ; Karlsson, Magnus ; Andrekson, Peter A.
Author_Institution :
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Gothenburg, Sweden
Abstract :
We suggest a method for pass/fail testing of PM-QPSK transmitters. The test is based on mask testing with time-resolved EVM and accepts transmitters where individual impairments cause less than 0.5 dB OSNR penalty. The design of the test is performed by computer simulations followed by experimental verification of some key results.
Keywords :
optical transmitters; quadrature phase shift keying; PM-QPSK transmitters; computer simulations; error vector magnitude; pass-fail testing; time-resolved EVM; transmitter mask testing;
Conference_Titel :
Optical Communication (ECOC 2013), 39th European Conference and Exhibition on
Conference_Location :
London
Electronic_ISBN :
978-1-84919-759-5
DOI :
10.1049/cp.2013.1367
