Title :
Effects of High Current and Temperature in Power MESFET Metallizations
Author :
Canali, Claudio ; Chiussi, Fabio ; Umena, Leonardo ; Vanzi, Massimo ; Zanoni, Enrico
Author_Institution :
Dipartimento di Elettronica ed Informatica, Universita´´ di Padova, Via Gradenigo 6/A, 35131 Padova (Italy)
Abstract :
Effects of high current density and temperature closely combine to degrade power MESFETs during their operating life in radio-link systems. To understand failure mechanisms and distinguish between those accelerated by high current and/or by temperature, we have performed various dc tests and measured thermal resistance and thermal maps of tested devices.
Keywords :
Current density; Failure analysis; Life estimation; MESFETs; Metallization; Performance evaluation; Temperature; Testing; Thermal degradation; Thermal resistance;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
