DocumentCode
1941212
Title
Nanoparticle measurement in the optical far-field
Author
Little, D.J. ; Kuruwita, R.L. ; Joyce, A. ; Gao, Q. ; Burgess, Thomas ; Jagadish, C. ; Kane, D.M.
Author_Institution
Dept. of Phys. & Astron., Macquarie Univ., Sydney, NSW, Australia
fYear
2013
fDate
12-16 May 2013
Firstpage
1
Lastpage
1
Abstract
Here, we present a new nano-characterization technique called Visible Interferometric Electromagnetic Wave Scattering (VIEWS), capable of leveraging the advantages of optical microscopy. VIEWS overcomes optical resolution limits by calculating nanoparticle characteristics directly from the optical phase measured using interferometric microscopy, rather than relying on image formation.
Keywords
electromagnetic wave scattering; light interferometry; nanoparticles; optical microscopy; interferometric microscopy; nano-characterization technique; nanoparticle measurement; optical far-field; optical microscopy; optical phase; optical resolution limits; visible interferometric electromagnetic wave scattering; Microscopy; Optical imaging; Optical interferometry; Optical microscopy; Optical scattering; Optical variables measurement; Phase measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location
Munich
Print_ISBN
978-1-4799-0593-5
Type
conf
DOI
10.1109/CLEOE-IQEC.2013.6802005
Filename
6802005
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