Title :
Nanoparticle measurement in the optical far-field
Author :
Little, D.J. ; Kuruwita, R.L. ; Joyce, A. ; Gao, Q. ; Burgess, Thomas ; Jagadish, C. ; Kane, D.M.
Author_Institution :
Dept. of Phys. & Astron., Macquarie Univ., Sydney, NSW, Australia
Abstract :
Here, we present a new nano-characterization technique called Visible Interferometric Electromagnetic Wave Scattering (VIEWS), capable of leveraging the advantages of optical microscopy. VIEWS overcomes optical resolution limits by calculating nanoparticle characteristics directly from the optical phase measured using interferometric microscopy, rather than relying on image formation.
Keywords :
electromagnetic wave scattering; light interferometry; nanoparticles; optical microscopy; interferometric microscopy; nano-characterization technique; nanoparticle measurement; optical far-field; optical microscopy; optical phase; optical resolution limits; visible interferometric electromagnetic wave scattering; Microscopy; Optical imaging; Optical interferometry; Optical microscopy; Optical scattering; Optical variables measurement; Phase measurement;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
DOI :
10.1109/CLEOE-IQEC.2013.6802005
