Dynamic pixel test pattern for CMOS image sensor

We propose a dynamic pixel test pattern for CIS (CMOS Image Sensor) to measure the performance of the pixel unit including TX (Transfer Transistor), DX (Amplifier Transistor), RX (Reset Transistor), SX (Select Transistor), FD (floating Diffusion) and PD (Photo Diode). The proposed TP (Test Pattern) was implemented and verified using a 90 nm CIS process. The proposed TP has well delivered the expected properties of pixel; blooming, pixel reset level, pixel output signal, pixel signal swing range and TX gate turn on pulse width which can only be guessed for a conventional TP. The measured parameters should help to optimize and improve the CIS design.