DocumentCode :
1941879
Title :
The Influence of Emitter Sidewall Injection on Transistor Noise Figure
Author :
Claessen, H.R. ; Geelen, J.A.M. ; De Graaff, H.G.
Author_Institution :
Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven - The Netherlands
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
897
Lastpage :
900
Keywords :
Bipolar transistors; Current measurement; Electrical resistance measurement; Geometry; Laboratories; Mercury (metals); Noise figure; Noise generators; Noise measurement; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436783
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1941879
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