مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1942216

Title :

Session 9: Matching

Author :

Poulter, Mark ; Tuinhout, Hans

Author_Institution :

Texas Instruments, USA

fYear :

2012

fDate :

19-22 March 2012

Firstpage :

217

Lastpage :

218

Abstract :

Start of the above-titled section of the conference proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on

Conference_Location :

San Diego, CA

ISSN :

1071-9032

Print_ISBN :

978-1-4673-1027-7

Type :

conf

DOI :

10.1109/ICMTS.2012.6190650

Filename :

6190650

Link To Document :