Title :
Active “multi-fingers”: Test structure to improve MOSFET matching in sub-threshold area
Author :
Joly, Y. ; Opez, L. ; Portal, J.-M. ; Aziza, H. ; Bert, Y. ; Julien, F. ; Fornara, P.
Author_Institution :
STMicroelectron., Rousset, France
Abstract :
Low power analog applications are often designed under threshold and can be degraded by hump effect. This effect is explained through device dimensions and body bias studies. A MOSFET matching improvement in sub-threshold area is demonstrated with active “multi-fingers” test structure.
Keywords :
MOSFET; MOSFET matching; active multi-fingers test structure; body bias study; hump effect; sub-threshold area; Logic gates;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1027-7
DOI :
10.1109/ICMTS.2012.6190652
