• DocumentCode
    1942266
  • Title

    Active “multi-fingers”: Test structure to improve MOSFET matching in sub-threshold area

  • Author

    Joly, Y. ; Opez, L. ; Portal, J.-M. ; Aziza, H. ; Bert, Y. ; Julien, F. ; Fornara, P.

  • Author_Institution
    STMicroelectron., Rousset, France
  • fYear
    2012
  • fDate
    19-22 March 2012
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    Low power analog applications are often designed under threshold and can be degraded by hump effect. This effect is explained through device dimensions and body bias studies. A MOSFET matching improvement in sub-threshold area is demonstrated with active “multi-fingers” test structure.
  • Keywords
    MOSFET; MOSFET matching; active multi-fingers test structure; body bias study; hump effect; sub-threshold area; Logic gates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4673-1027-7
  • Type

    conf

  • DOI
    10.1109/ICMTS.2012.6190652
  • Filename
    6190652
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1942266