Title :
Failure Analysis of GaAlAs Emitters
Author :
Conte, G. ; Fantini, F. ; Magistrali, F. ; Vanzi, M.
Author_Institution :
Telettra S. p. A., Quality and Reliability Dept. - 20059 Vimercate - Italy
Abstract :
The techniques used in characterizing the GaAs based lasers and LED´s are described and failure analysis results are reported for devices coming from incoming inspection, qualification, equipment production and field application. A detailed classification of failure modes and the correlation with failure mechanisms is shown by dividing among external overstresses, package and die-related problems.
Keywords :
Electron optics; Failure analysis; Gallium arsenide; Inspection; Optical microscopy; Optical surface waves; Packaging; Scanning electron microscopy; Surface emitting lasers; Testing;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
