Title :
Low-cost tunneling accelerometer technology for high dynamic range applications
Author :
Kubena, R.L. ; Stratton, F.P. ; Vickers-Kirby, D.J. ; Joyce, R.J. ; Chang, D.T. ; Schimert, T. ; Gooch, R.W.
Author_Institution :
LLC, HRL Labs., Malibu, CA, USA
Abstract :
We have developed high dynamic range (105-106 g´s) tunneling accelerometers that may be ideal for smart munitions applications. These highly miniaturized surface-micromachined devices can be manufactured at very low cost and integrated on chip with the control electronics. Fully integrated sensors may provide advantages in minimizing microphonics for high-g applications. Previously, we described initial test results using electrostatic forces generated by a self-test electrode located under a Au cantilever. We describe the testing of Ni and Au cantilever devices on a shaker table using a novel, low input voltage (5 V) servo controller on both printed wiring board and surface-mount control circuitry. In addition, we report our initial test results for devices packaged using a low-temperature wafer-level vacuum packaging technique for low-cost manufacturing
Keywords :
accelerometers; automatic testing; integrated circuit packaging; integrated circuit testing; micromachining; printed circuits; servomechanisms; surface mount technology; weapons; 5 V; Au; IC; Ni; cantilever devices; control electronics; electrostatic forces; high dynamic range applications; high-g applications; integrated sensors; low input voltage servo controller; low-cost tunneling accelerometer; low-temperature wafer-level vacuum packaging; microphonics; miniaturized surface-micromachined devices; printed wiring board; self-test electrode; shaker table; smart munitions applications; surface-mount control circuitry; test results; Accelerometers; Circuit testing; Dynamic range; Gold; Manufacturing; Packaging; Tunneling; Voltage control; Wafer scale integration; Weapons;
Conference_Titel :
Position Location and Navigation Symposium, IEEE 2000
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5872-4
DOI :
10.1109/PLANS.2000.838348