DocumentCode
1942927
Title
Hybrid integration of VCSELs to foundry fabricated smart pixels
Author
Pu, R. ; Hayes, E.M. ; Wilmsen, C.W. ; Choquette, K.D. ; Geib, K.M. ; Hou, H.Q.
Author_Institution
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear
1997
fDate
11-13 Aug. 1997
Firstpage
25
Lastpage
26
Abstract
An opto-electronic integrated circuit (OEIC) smart pixel is a structure composed of optical inputs and/or outputs interconnected to electronic processing circuitry. The optical I/O allows the data to be read in 2-D page oriented formats. This circumvents the bottlenecks in the electrical interconnections and improves speed by reducing the capacitance and inductance of the wirebonds. Recently, we have reported the successful hybrid integration of VCSELs to a foundry fabricated OEIC by flip-chip bump-bonding a back-emitting VCSEL array. In this paper we present the results of improved integration processing and VCSEL design that will increase yields and mechanical and electrical robustness. In addition, a new approach to bonding VCSELs directly to the smart pixels is presented.
Keywords
flip-chip devices; optical interconnections; semiconductor laser arrays; smart pixels; surface emitting lasers; 2-D page oriented formats; OEIC; VCSEL; back-emitting VCSEL array; direct bonding; electrical robustness; electronic processing circuitry; flip-chip bump-bonding; foundry fabricated smart pixels; hybrid integration; improved integration processing; interconnection; mechanical robustness; optical inputs; optical outputs; opto-electronic integrated circuit; yields; Capacitance; Foundries; Inductance; Integrated circuit interconnections; Integrated optics; Optical interconnections; Optoelectronic devices; Photonic integrated circuits; Smart pixels; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location
Montreal, Que., Canada
Print_ISBN
0-7803-3891-X
Type
conf
DOI
10.1109/LEOSST.1997.619089
Filename
619089
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