Title :
Extraction of high-frequency equivalent network parameters of HBT´s by low-frequency extrapolation of microwave S-parameter data
Author :
John, Eugene ; Das, Mukunda B. ; Yang, Li-Wu ; Liu, S.M.J.
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT´s. The method involves measurements of the device´s small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (rbb´, and ree´ ), the shunt capacitance elements (cje, cbc and cc), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects
Keywords :
S-parameters; capacitance; equivalent circuits; extrapolation; heterojunction bipolar transistors; network parameters; semiconductor device models; solid-state microwave devices; HBT modelling; collector bias currents; high-frequency HBT; high-frequency equivalent network parameters; intrinsic emitter-to-collector transit time; low-frequency extrapolation; microwave S-parameter data; parameter extraction; parasitic series resistance elements; parasitic time constant effects; shunt capacitance elements; small-signal parameters; transformed two-port parameters; Capacitance measurement; Current measurement; Data mining; Electrical resistance measurement; Extrapolation; Frequency measurement; Heterojunction bipolar transistors; Laboratories; Scattering parameters; Transconductance;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1993. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-0894-8
DOI :
10.1109/CORNEL.1993.303079