DocumentCode
1943399
Title
CIT 1 and CIT 2, Advanced Non Epitaxial Bipolar/CMOS Processes for Analog-Digital VLSI
Author
Volz, C. ; Blossfeld, L.
Author_Institution
ITT Intermetall, Hans-Bunte-Strz. 19, D-7800 Freiburg, F.R.G.
fYear
1988
fDate
13-16 Sept. 1988
Abstract
Deux processus Bipolaire/CMOS de haute performance ont été développés; les processus CIT 1 (2.0 ¿m) et CIT 2 (1.5 ¿m). La technologie CIT n´utilise ni l´epitaxie ni le buried layer. Des transistors bipolaires (npn, pnp) et des transistors MOS (canal n, canal p) sont implantes avec succes sur un meme chip sans diminuer les performances des deux technologies en présence. Two N-well high performance Bipolar/CMOS processes have been developed; a 2.0 ¿m CIT 1 process and CIT 2, a 1.5 ¿m process. CIT technology uses neither epitaxie nor buried layer. Bipolar transistors (npn and pnp) and MOS transistors (n-channel and p-channel) have been sucessfully fabricated on the same chip without a decrease of the performance.
Keywords
Analog-digital conversion; Bipolar transistors; CMOS process; CMOS technology; Conductivity; Ion implantation; Irrigation; MOSFETs; Silicides; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location
Montpellier, France
Print_ISBN
2868830994
Type
conf
Filename
5436853
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