• DocumentCode
    1943399
  • Title

    CIT 1 and CIT 2, Advanced Non Epitaxial Bipolar/CMOS Processes for Analog-Digital VLSI

  • Author

    Volz, C. ; Blossfeld, L.

  • Author_Institution
    ITT Intermetall, Hans-Bunte-Strz. 19, D-7800 Freiburg, F.R.G.
  • fYear
    1988
  • fDate
    13-16 Sept. 1988
  • Abstract
    Deux processus Bipolaire/CMOS de haute performance ont été développés; les processus CIT 1 (2.0 ¿m) et CIT 2 (1.5 ¿m). La technologie CIT n´utilise ni l´epitaxie ni le buried layer. Des transistors bipolaires (npn, pnp) et des transistors MOS (canal n, canal p) sont implantes avec succes sur un meme chip sans diminuer les performances des deux technologies en présence. Two N-well high performance Bipolar/CMOS processes have been developed; a 2.0 ¿m CIT 1 process and CIT 2, a 1.5 ¿m process. CIT technology uses neither epitaxie nor buried layer. Bipolar transistors (npn and pnp) and MOS transistors (n-channel and p-channel) have been sucessfully fabricated on the same chip without a decrease of the performance.
  • Keywords
    Analog-digital conversion; Bipolar transistors; CMOS process; CMOS technology; Conductivity; Ion implantation; Irrigation; MOSFETs; Silicides; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
  • Conference_Location
    Montpellier, France
  • Print_ISBN
    2868830994
  • Type

    conf

  • Filename
    5436853