Title :
OSIRIS II, A Two-Dimensional Process Simulator for SIMOX Structures
Author :
Sweid, I. ; Guillemot, N. ; Kamarinos, G.
Author_Institution :
INPG/ENSERG, Laboratoire de Physique des Composants a Semiconducteurs, CNRS-UA 840, 23, Av. des Martyrs, F-38031 Grenoble Cedex, France
Abstract :
The simulation of technological processes is very important for the fabrication of integrated circuits. In this paper, the authors present OSIRIS II for the simulation on SIMOX structures. The program takes into account the limiting conditions associated with this material. The models used are briefly recalled. Finally, a complete simulation of an N-MOS device on SIMOX is presented.
Keywords :
Analytical models; Boron; Circuit simulation; Fabrication; Impurities; Integrated circuit technology; Nonlinear equations; Resists; Resumes; Silicon;
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France