DocumentCode :
1943523
Title :
OSIRIS II, A Two-Dimensional Process Simulator for SIMOX Structures
Author :
Sweid, I. ; Guillemot, N. ; Kamarinos, G.
Author_Institution :
INPG/ENSERG, Laboratoire de Physique des Composants a Semiconducteurs, CNRS-UA 840, 23, Av. des Martyrs, F-38031 Grenoble Cedex, France
fYear :
1988
fDate :
13-16 Sept. 1988
Abstract :
The simulation of technological processes is very important for the fabrication of integrated circuits. In this paper, the authors present OSIRIS II for the simulation on SIMOX structures. The program takes into account the limiting conditions associated with this material. The models used are briefly recalled. Finally, a complete simulation of an N-MOS device on SIMOX is presented.
Keywords :
Analytical models; Boron; Circuit simulation; Fabrication; Impurities; Integrated circuit technology; Nonlinear equations; Resists; Resumes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France
Print_ISBN :
2868830994
Type :
conf
Filename :
5436859
Link To Document :
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