Title :
Evaluation of Mobility in Graphene Nanoribbons Including Line Edge Roughness Scattering
Author :
Zeng, Lang ; Liu, Xiao Yan ; Du, Gang ; Kang, Jin Feng ; Han, Ru Qi
Author_Institution :
Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Beijing, China
Abstract :
This work employs single particle Monte Carlo method to calculation the electron mobility in graphene nanoribbons including phonon scattering (acoustic and optical) and line edge roughness scattering. Mobility as high as 2 times 104 cm2/Vs is obtained and when the GNRs width is 2 nm, the mobility reduces to only about 200 cm2/Vs. These results agree well with experiment results. Also the effect of roughness parameters on mobility is analyzed.
Keywords :
Monte Carlo methods; electron mobility; graphene; nanostructured materials; phonons; C; electron mobility; graphene nanoribbons; line edge roughness scattering; phonon scattering; single particle Monte Carlo method; Acoustic scattering; Electron mobility; Electron optics; Microelectronics; Monte Carlo methods; Nanoscale devices; Optical scattering; Particle scattering; Phonons; Stimulated emission;
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2009. SISPAD '09. International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-3974-8
Electronic_ISBN :
1946-1569
DOI :
10.1109/SISPAD.2009.5290209
