DocumentCode :
1943775
Title :
An Ultra High Speed Trench Isolated Double Polysilicon Bipolar Process
Author :
Wilson, M.C. ; Duncan, S. ; Hunt, P.C.
Author_Institution :
Plessey Research (Caswell) Ltd., Caswell, Towcester, Northants, Great-Britain
fYear :
1988
fDate :
13-16 Sept. 1988
Abstract :
This paper describes a double polysilicon bipolar process incorporating a novel self-aligned emitter-base and deep trench isolation. The process has been designed primarily for ultra high speed by minimising parasitic capacitances, and also offers high packing densities. The performance of the technology is demonstrated by a 1/8 static divider operating at a frequency of 10.7GHz. Other representative SSI functions are also described.
Keywords :
Circuits; Dielectric substrates; Etching; Frequency conversion; Isolation technology; Metallization; Parasitic capacitance; Protection; Space technology; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France
Print_ISBN :
2868830994
Type :
conf
Filename :
5436871
Link To Document :
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