• DocumentCode
    1943817
  • Title

    Two-wavelength (visible/infrared) femtosecond spectroscopy of the dynamics of holes in GaAs

  • Author

    Ganihanov, F.S. ; Burr, R.C. ; Schremer, A.T. ; Tang, C.L.

  • Author_Institution
    Cornell Univ., Ithaca, NY, USA
  • fYear
    1998
  • fDate
    8-8 May 1998
  • Firstpage
    105
  • Lastpage
    106
  • Abstract
    Summary form only given.This paper reports results on the ultrafast dynamics of holes in GaAs measured using a recently developed broadly tunable femtosecond optical parametric oscillator. With this source it is possible to pump valence-to-conduction band transitions with visible pulses and probe the generated holes using mid-infrared pulses, which excite transitions between the heavy- or light-hole bands and the split-off band. The advantage of such a two-wavelength spectroscopic measurement is that both the pumping and the probing take place between a fully empty or fully occupied band and a band occupied by only the carriers of interest.
  • Keywords
    III-V semiconductors; gallium arsenide; hole density; hole mobility; infrared spectra; optical coherent transients; optical pumping; semiconductor epitaxial layers; time resolved spectra; visible spectra; GaAs; epitaxial layers; fully empty band; fully occupied band; heavy-hole bands; light-hole bands; mid-infrared pulses; photoexcitation; pump-probe technique; split-off band; tunable femtosecond optical parametric oscillator; two-wavelength femtosecond spectroscopy; ultrafast dynamics of holes; valence-to-conduction band transitions; visible pulses; visible/infrared femtosecond spectroscopy; Charge carrier density; Charge carrier processes; Delay; Gallium arsenide; Infrared spectra; Optical pulse generation; Optical reflection; Probes; Pulse measurements; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-541-2
  • Type

    conf

  • DOI
    10.1109/IQEC.1998.680219
  • Filename
    680219