Title :
A new method and instrument for measurement of plant leaf area
Author :
Zhang, Derong ; He, Yong
Author_Institution :
Ningbo Inst. of Technol., Zhejiang Univ., Ningbo, China
Abstract :
A algorithm with minimum memory consumption for labeling connected components in a binary image is presented in this paper. Based on embedded system technology, the algorithm is used in calculating the area of leaves, the high resolution images for this feature is provided by cheap scanner. Using the algorithm, a corresponding image processing program is developed, and it is ported successfully in embedded Linux & QT platform. With higher precision and lower cost, a new portable measuring instrument is developed for leaf area measurement.
Keywords :
botany; embedded systems; feature extraction; image resolution; image scanners; QT platform; binary image; embedded Linux; embedded system technology; image processing; images resolution; plant leaf area index; scanner; Accuracy; Area measurement; Filtering algorithms; Instruments; Labeling; Random access memory; Shape measurement; Leaf Area Index; component; embedded system; improved label method; portable measuring instrument;
Conference_Titel :
Intelligent Systems and Knowledge Engineering (ISKE), 2010 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4244-6791-4
DOI :
10.1109/ISKE.2010.5680761
