• DocumentCode
    1944072
  • Title

    Fabrication of silicon carriers with TSV electrical interconnections and embedded thermal solutions for high power 3-D package

  • Author

    Yu, Aibin ; Khan, Navas ; Archit, Giridhar ; Pinjala, Damaruganath ; Toh, Kok Chuan ; Kripesh, Vaidyanathan ; Yoon, Seung Wook ; Lau, John H.

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    This paper presents micro fabrication process and wafer level integration of a silicon carrier, in which optimized liquid cooling layers are embedded. Two or more carriers can then be stacked together with a silicon interposer in between to make up of a stacked cooling module for high power heat dissipation. Wafer bonding are carried out with AuSn-solder which deposited by evaporation and the shear strength is higher than 27.2 MPa after bonding, which is high enough for application. The advantage of this 3-D stacking method is that it provides a method of simultaneous realizing electrical interconnection and fluidic path between two carriers and it can extract heat from the constraints of 3-D silicon module chips to surface without external liquid circulation.
  • Keywords
    interconnections; wafer bonding; wafer level packaging; wafer-scale integration; TSV electrical interconnections; embedded thermal solutions; external liquid circulation; heat extraction; high power 3D package; high power heat dissipation; interconnection-fluidic path; silicon carrier fabrication; wafer bonding; wafer level integration; Fabrication; Liquid cooling; Packaging; Power system management; Silicon; Stacking; Thermal management; Through-silicon vias; Wafer bonding; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4549945
  • Filename
    4549945