DocumentCode
1944072
Title
Fabrication of silicon carriers with TSV electrical interconnections and embedded thermal solutions for high power 3-D package
Author
Yu, Aibin ; Khan, Navas ; Archit, Giridhar ; Pinjala, Damaruganath ; Toh, Kok Chuan ; Kripesh, Vaidyanathan ; Yoon, Seung Wook ; Lau, John H.
Author_Institution
Inst. of Microelectron., Singapore
fYear
2008
fDate
27-30 May 2008
Firstpage
24
Lastpage
28
Abstract
This paper presents micro fabrication process and wafer level integration of a silicon carrier, in which optimized liquid cooling layers are embedded. Two or more carriers can then be stacked together with a silicon interposer in between to make up of a stacked cooling module for high power heat dissipation. Wafer bonding are carried out with AuSn-solder which deposited by evaporation and the shear strength is higher than 27.2 MPa after bonding, which is high enough for application. The advantage of this 3-D stacking method is that it provides a method of simultaneous realizing electrical interconnection and fluidic path between two carriers and it can extract heat from the constraints of 3-D silicon module chips to surface without external liquid circulation.
Keywords
interconnections; wafer bonding; wafer level packaging; wafer-scale integration; TSV electrical interconnections; embedded thermal solutions; external liquid circulation; heat extraction; high power 3D package; high power heat dissipation; interconnection-fluidic path; silicon carrier fabrication; wafer bonding; wafer level integration; Fabrication; Liquid cooling; Packaging; Power system management; Silicon; Stacking; Thermal management; Through-silicon vias; Wafer bonding; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4549945
Filename
4549945
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