Title :
Infra-red image detection with a Si-CCD image sensor due to the two-photon absorption process
Author :
Pei Gee Chua ; Tanaka, Y. ; Takeda, M. ; Kurokawa, T.
Author_Institution :
Tokyo Univ. of Agric. & Technol., Japan
Abstract :
Infra-red images were captured by a Si-CCD image sensor. The Si-CCD showed quadratic sensitivity characteristics due to the two-photon absorption process for high intensity light with a wavelength of 1550 nm.
Keywords :
CCD image sensors; infrared imaging; two-photon processes; 1550 nm; IR image detection; Si; Si-CCD image sensor; high intensity light; quadratic sensitivity characteristics; two-photon absorption process; Agriculture; Electric variables measurement; Electromagnetic wave absorption; Image sensors; Infrared detectors; Infrared image sensors; Laser beams; Optical fiber sensors; Pulse measurements; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.967934
