DocumentCode
1944528
Title
``WCAP´´ : Worst Case Analysis Program : A Tool for Statistical Circuit Simulation
Author
Ballay, N. ; Baylac, B.
Author_Institution
SGS-Thomson Microelectronics, Central R and D/CIS/TDMC, BP 217, F-38019 Grenoble Cedex, France
fYear
1988
fDate
13-16 Sept. 1988
Abstract
The goal of `WCAP´ Program is to extract automatically first order CAD model parameter spreads directly from various histograms of classical indicators (threshold voltage, static currents, ...) usually measured on industrial parametric testers.
Keywords
Analytical models; Automatic testing; Circuit simulation; Circuit testing; Computational Intelligence Society; Computer aided software engineering; Histograms; Microelectronics; Probability; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location
Montpellier, France
Print_ISBN
2868830994
Type
conf
Filename
5436904
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