Title :
``WCAP´´ : Worst Case Analysis Program : A Tool for Statistical Circuit Simulation
Author :
Ballay, N. ; Baylac, B.
Author_Institution :
SGS-Thomson Microelectronics, Central R and D/CIS/TDMC, BP 217, F-38019 Grenoble Cedex, France
Abstract :
The goal of `WCAP´ Program is to extract automatically first order CAD model parameter spreads directly from various histograms of classical indicators (threshold voltage, static currents, ...) usually measured on industrial parametric testers.
Keywords :
Analytical models; Automatic testing; Circuit simulation; Circuit testing; Computational Intelligence Society; Computer aided software engineering; Histograms; Microelectronics; Probability; Semiconductor device modeling;
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France
