DocumentCode :
1944888
Title :
Losses of insulated gate bipolar transistor in HF resonant converters
Author :
Bourgeois, J.M. ; Maurice, B.
Author_Institution :
SGS-Thomson Microelectron., Rousset, France
fYear :
1989
fDate :
1-5 Oct. 1989
Firstpage :
1197
Abstract :
The authors investigate the operational limitations of insulated-gate bipolar transistors (IGBTs) in HF resonant converters. The analysis takes into consideration the thermal balance and the maximum current density achieved by the IGBTs in resonant converters. The major resonant subcircuits are described, and the duality rules allowing these circuits to replace other configurations are discussed. A practical circuit is presented, emphasizing driving and protection to achieve the maximum performance of the IGBT in resonant converters.<>
Keywords :
bipolar transistors; insulated gate field effect transistors; losses; power convertors; HF resonant converters; insulated gate bipolar transistor; maximum current density; thermal balance; Commutation; Current density; Frequency conversion; Hafnium; Insulated gate bipolar transistors; RLC circuits; Resonance; Switches; Switching converters; Zero voltage switching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 1989., Conference Record of the 1989 IEEE
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/IAS.1989.96795
Filename :
96795
Link To Document :
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