DocumentCode
1944958
Title
Electrical Behaviour and Modelling of a N-Doped a-Si:H Emitter Bipolar Transistor
Author
Bonnaud, O. ; Gharib, A. El ; Sahnoune, M.
Author_Institution
Groupe de Microélectronique, Université Rennes I, Campus de BeauIieu, F-35042 Rennes Cedex, France
fYear
1988
fDate
13-16 Sept. 1988
Keywords
Aluminum; Amorphous silicon; Annealing; Bipolar transistors; Chromium; Doping; Heterojunction bipolar transistors; Ion implantation; Substrates; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location
Montpellier, France
Print_ISBN
2868830994
Type
conf
Filename
5436924
Link To Document