DocumentCode :
1945067
Title :
Electron Traps, Structural Change, and Hydrogen Related Simox Defects
Author :
Conley, J.F. ; Lenahan, P.M. ; Roitman, P.
Author_Institution :
The Pennsylvania State University, PA
fYear :
1992
fDate :
6-8 Oct. 1992
Firstpage :
26
Lastpage :
27
Keywords :
Charge carrier processes; Charge measurement; Current measurement; Electron traps; Hydrogen; Lighting; NIST; Paramagnetic materials; Paramagnetic resonance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
ISSN :
1078-621X
Print_ISBN :
0-7803-7439-8
Type :
conf
DOI :
10.1109/SOI.1992.664778
Filename :
664778
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1945067
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