Title : 
New fully differential instrumental chain for Hall sensor signal conditioning integrated in standard 0.35 μm CMOS process
         
        
            Author : 
Ouffoue, Cyrius ; Frick, VIncent ; Kern, Christian ; Hébrard, Luc
         
        
            Author_Institution : 
UdS-CNRS, Inst. d´´Electron. du Solide et des Syst. (InESS), Strasbourg, France
         
        
        
            fDate : 
June 28 2009-July 1 2009
         
        
        
        
            Abstract : 
This paper describes a new integrated fully differential analogue instrumental chain dedicated to magnetic field measurement. This chain features a silicon Horizontal Hall Device, high CMRR low thermal noise instrumentation amplifiers as well as a modulation - demodulation system based on the chopper stabilized technique operated at 100 kHz. This allows offset and 1/f noise cancellation by multistage high-pass filtering. The system achieves 10 muT resolution (experimental) over a 3.6 kHz bandwidth by applying 100 kHz spinning current to the Hall Device.
         
        
            Keywords : 
1/f noise; CMOS analogue integrated circuits; Hall effect devices; choppers (circuits); high-pass filters; instrumentation amplifiers; magnetic field measurement; magnetic sensors; modems; signal processing equipment; CMOS process; Hall sensor signal conditioning; bandwidth 3.6 kHz; chopper stabilization; differential instrumentation amplifier; frequency 100 kHz; horizontal Hall device; integrated fully differential analogue instrumental chain; magnetic field measurement; modulation-demodulation system; multistage high-pass filtering; spinning current; thermal noise; CMOS process; Demodulation; Instruments; Low-noise amplifiers; Magnetic field measurement; Magnetic noise; Magnetic sensors; Noise cancellation; Signal processing; Silicon;
         
        
        
        
            Conference_Titel : 
Circuits and Systems and TAISA Conference, 2009. NEWCAS-TAISA '09. Joint IEEE North-East Workshop on
         
        
            Conference_Location : 
Toulouse
         
        
            Print_ISBN : 
978-1-4244-4573-8
         
        
            Electronic_ISBN : 
978-1-4244-4574-5
         
        
        
            DOI : 
10.1109/NEWCAS.2009.5290418