Title :
A new approach for variability analysis of analog ICs
Author :
Filiol, Hubert ; O´Connor, Ian ; Morche, Dominique
Author_Institution :
Lyon Inst. of Nanotechnol., Univ. of Lyon - Ecole Centrale de Lyon, Ecully, France
fDate :
June 28 2009-July 1 2009
Abstract :
The impact of process variability in nanoscale circuits has traditionally been handled with Monte Carlo analysis. In this paper, we propose a new method to estimate the variation bounds of circuit performance, that combines response surface modeling techniques with the Cornish-Fisher expansion: process parameter variations are first mapped to circuit performance metrics by a quadratic model, then an analytical approximation of the performance distribution´s quantiles enables enclosure of the performance variations. The proposed method demonstrates an excellent accuracy/efficiency ratio compared to Monte Carlo-based methods.
Keywords :
analogue integrated circuits; approximation theory; nanoelectronics; response surface methodology; Cornish-Fisher expansion; analog IC; analytical approximation; circuit performance metrics; nanoscale circuits; process parameter variations; process variability analysis; quadratic model; response surface modeling technique; variation bound estimation; Analytical models; CMOS technology; Circuit optimization; Circuit simulation; Computational modeling; Linear approximation; Monte Carlo methods; Nanotechnology; Performance analysis; Response surface methodology;
Conference_Titel :
Circuits and Systems and TAISA Conference, 2009. NEWCAS-TAISA '09. Joint IEEE North-East Workshop on
Conference_Location :
Toulouse
Print_ISBN :
978-1-4244-4573-8
Electronic_ISBN :
978-1-4244-4574-5
DOI :
10.1109/NEWCAS.2009.5290422