Title :
The effects of background contrast on conformal mesh microwave breast imaging
Author :
Meaney, P.M. ; Li, D. ; Paulsen, Keith D.
Author_Institution :
Thayer Sch. of Eng., Dartmouth Coll., Hanover, NH, USA
Abstract :
We have developed a prototype saline-coupled microwave breast imaging system with a non-contacting monopole antenna array. We have demonstrated in simulation and phantom experiments that the detection of internal features can be enhanced as the parameter reconstruction mesh approaches the exact breast perimeter. However, in the case of a homogeneous breast phantom we have also observed a centrally located artifact in some recovered images which could be interpreted as a false positive detection in an actual patient examination. Simulation results presented here illustrate that if the electrical property contrast between the background medium and breast is reduced, the conformal meshing approach can be used successfully with only a minimal central artifact while retaining the improved inclusion detection characteristics associated with the conformal mesh technique.
Keywords :
biomedical imaging; image reconstruction; image sequences; mammography; medical image processing; microwave antenna arrays; microwave imaging; monopole antenna arrays; phantoms; tumours; background contrast; background medium; centrally located artifact; conformal mesh microwave breast imaging; electrical property contrast; exact breast perimeter; false positive detection; homogeneous breast phantom; inclusion detection characteristics; internal feature detection; minimal central artifact; noncontacting monopole antenna array; parameter reconstruction mesh; phantom experiments; recovered images; saline-coupled microwave breast imaging system; simulation; tumor inclusions; Breast; Cancer; Costs; Design engineering; Geometry; Image reconstruction; Imaging phantoms; Microwave antenna arrays; Microwave imaging; Prototypes;
Conference_Titel :
Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE
Print_ISBN :
0-7803-7211-5
DOI :
10.1109/IEMBS.2001.1017251