An accurate soft error propagation analysis technique considering temporal masking disablement

This paper presents an accurate soft error propagation analysis technique for processor SER evaluation. Especially, we focus on Single Event Upset (SEU) in flip-flop which is a main contributor of processor SER. SEUs in flip-flops propagate combinational circuits with temporal masking and logical masking effects. The temporal masking is disabled when the erroneous flip-flop is disabled. The proposed technique is able to evaluate temporal masking disablement by combined analysis of temporal and logical effects. Experimental result shows that the proposed technique reduces 49.87% inaccuracy in average compared with the technique ignoring temporal masking disablement when the enabled probability of the erroneous flip-flop is 0.1.