Title :
The Break Failure Analysis of the 65Mn Chain Mat
Author :
Fan Chengyan ; Sun Wei ; Sun Zhipeng
Author_Institution :
Chain Driven Acad., Jilin Univ., Changchun, China
Abstract :
The author used the electronic optical instrument to carry on macroscopic, the microscopic observation and the metallographic examination to the 65Mn break chain mat fracture, has given the primary cause which the chain mat break failure, and explained the mechanism which in the chain mat the hole surface microcrack formed, to improve the chain mat quality to provide the rationale.
Keywords :
chains; fracture; microcracks; plates (structures); 65Mn break chain mat fracture; break failure analysis; electronic optical instrument; hole surface microcrack; macroscopic observation; metallographic examination; microscopic observation; Educational institutions; Ferrites; Punching; Scanning electron microscopy; Surface cracks; Surface treatment; chain mat; failure analysis; inspection; microcrackle;
Conference_Titel :
Digital Manufacturing and Automation (ICDMA), 2011 Second International Conference on
Conference_Location :
Zhangjiajie, Hunan
Print_ISBN :
978-1-4577-0755-1
Electronic_ISBN :
978-0-7695-4455-7
DOI :
10.1109/ICDMA.2011.301
