• DocumentCode
    1946160
  • Title

    Angled high strain rate shear testing for SnAgCu solder balls

  • Author

    Chai, T.C. ; Yu, D.Q. ; Lau, J. ; Zhu, W.H. ; Zhang, X.R.

  • Author_Institution
    Inst. of Microelectron., A*STAR, Singapore
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    623
  • Lastpage
    628
  • Abstract
    A high speed shear test of solder ball at different shear angles has been developed and investigated for SnAgCu solder balls. The objective of the test is to introduce vertical loading component in the high speed shear test and to study intermetallic response of different solder balls. The shear test is performed at three angles of attack e. g. 3, 5 and 10 degree. The basic shear tester allow high speed shear tool movement of up to 4000 mm per second, and capture the load-displacement curve experienced by the shear tool. Using this setup, high-speed shear characterization has been carried out on microBGA sample with Sn3Ag0.5Cu and Sn1Ag0.5Cu solder on Ni/Au pad finish. In this paper, the effect of angle shear at high speed on these SnAgCu BGA balls is presented, with the details of load-displacement response and failure mode for these solder balls. Generally all the samples show changes in ductile-to-brittle failure as shear speed increases. The angled shear test lead to down shift of ductile-brittle transition to occur at lower shear speed with larger shear angle. It is found to improve sensitivity in revealing brittle failure for solder ball characterization.
  • Keywords
    ball grid arrays; copper alloys; ductile-brittle transition; mechanical testing; reliability; silver alloys; soldering; solders; tin alloys; Ni-Au pad finish; NiAu; Sn1Ag0.5Cu solder; Sn3Ag0.5Cu solder; SnAgCu; angle shear; angled high strain rate shear testing; ductile-brittle transition; failure mode; high speed shear test; intermetallic response; load-displacement curve; microBGA; shear tool; solder ball; vertical loading; Assembly; Capacitive sensors; Gold; Manufacturing; Microelectronics; Performance evaluation; Scanning electron microscopy; Soldering; Tensile stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550037
  • Filename
    4550037