DocumentCode :
1946466
Title :
Workload characterization and prediction: A pathway to reliable multi-core systems
Author :
Zaman, Monir ; Ahmadi, Ali ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
116
Lastpage :
121
Abstract :
As a result of technology scaling, power density of multi-core chips increases and leads to temperature hot-spots which accelerate device aging and chip failure. Moreover, intense efforts to reduce power consumption by employing low-power techniques decrease the reliability of new design generations. Traditionally, reactive thermal/power management techniques have been used to take appropriate action when the temperature reaches a threshold. However, these approaches do not always balance temperature and, as a result, may degrade system reliability. Therefore, to distribute temperature evenly across all cores, a proactive mechanism is needed to forecast future workload characteristics and the corresponding temperature, in order to make decisions before hot spots occur. Such proactive methods rely on an engine to precisely predict future workload characteristics. In this work, we first discuss the state-of-the-art methods for predicting workload dynamics and we compare their performance. We, then, introduce a prediction method based on Support Vector Regression (SVR), which accurately predicts the workload behavior several steps ahead. To evaluate the effectiveness of our approach, we use several programs from the PARSEC benchmark suite on an UltraSPARC T1 processor running the Sun Solaris operating system and we extract architectural traces. Then, the extracted traces are used to generate power and thermal profiles for each core using the McPAT and Hot-Spot simulators. Our results show that the proposed method forecasts workload dynamics and power very accurately and outperforms previous prediction techniques.
Keywords :
benchmark testing; decision making; low-power electronics; multiprocessing systems; power aware computing; regression analysis; reliability; support vector machines; temperature distribution; McPAT simulators; PARSEC benchmark suite; SVR based prediction method; Sun Solaris operating system; UltraSPARC T1 processor; architectural trace extraction; chip failure; decision making; device aging; hot-spot simulators; low-power techniques; multicore chips; multicore systems; power consumption; power density; power profiles; reactive thermal-power management techniques; support vector regression based prediction method; system reliability; technology scaling; temperature distribution; thermal profiles; workload characterization; workload dynamics prediction; workload prediction; Adaptation models; Forecasting; Predictive models; Radiation detectors; Temperature; Thermal management; Time series analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229843
Filename :
7229843
Link To Document :
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