DocumentCode :
1946517
Title :
Filtering-based error-tolerability evaluation of image processing circuits
Author :
Tong-Yu Hsieh ; Yi-Han Peng
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
132
Lastpage :
137
Abstract :
For some systems errors can be regarded as being acceptable as long as their significance is low enough. Image processing circuits are one such example due to human being´s insensitivity to minor errors in colors. Significant errors usually destroy the structure of an image, and thus appear to be perceptible. This also makes larger changes to the frequency feature of the image. By examining the degree at which the frequency is varied, the acceptability of errors can be determined. In this work we propose a filtering-based test method that can quantify the frequency variance incurred by errors. According to the obtained variance value, the acceptability of an image can be determined by comparing the value with user-specified thresholds. The experimental results on a large number of erroneous benchmark images show that the proposed method can accurately differentiate unacceptable images from acceptable ones. The implementation of the proposed method is simple, and thus can facilitate implementation of a BIST (Built-In Self-Test) circuitry for efficient product grading, as well as in-field reliability determination and enhancement. This is useful when the target circuit is employed in some critical applications such as automotive or medical electronic systems.
Keywords :
built-in self test; feature extraction; filtering theory; BIST circuitry; benchmark images; built-in self-test circuitry; filtering-based error-tolerability evaluation; filtering-based test method; frequency variance; human being insensitivity; image frequency feature; image processing circuits; in-field reliability determination; product grading; system errors; user-specified thresholds; Decision support systems; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229846
Filename :
7229846
Link To Document :
بازگشت