Title :
Decay mechanisms of lumen and chromaticity for high-power phosphor-based white-light-emitting diodes in thermal aging
Author :
Hsu, Yi-Cheng ; Tsai, Chun-Chin ; Chen, Ming-Hung ; Lo, Yuan-Tsun ; Lee, Chao-Wei ; Cheng, Wood-Hi
Author_Institution :
Biomecharronics Eng., Nat. Pingrung Univ. of Sci. & Technol., Kaohsiung
Abstract :
The high-power phosphor-based white-light-emitting diodes (LEDs) with different thicknesses and concentrations of silicone YAG phosphor after thermal aging at 150 degree C and 500 hours are studied experimentally. The results showed that the lumen loss and chromaticity (CIE) blue shift of the high-power white-light LEDs increased as the silicone YAG phosphor thickness and concentration increased. These were due to that the transmittance loss of the silicone YAG phosphor increased and the spectrum intensity of the white- light LEDs decreased as the aging time increased and resulted in lower emission efficiency of the high-power white-light LEDs. The likely cause for transmittance reduction is the refractive index decreased in the silicone YAG phosphor after thermal aging. As a result, the key module package related degradation mode under thermal aging was identified as the decay of the silicone YAG phosphor. Therefore, in order to maintain lumen power and minimize color shift of the high- power white-light LEDs modules for use in low-cost lighting and commercial applications, the optimized thickness and concentration of the YAG phosphor are 2 mm and 2%, respectively.
Keywords :
ageing; light emitting diodes; optical losses; phosphors; silicones; yttrium compounds; YAG; chromaticity; color shift; emission efficiency; high-power white-light-emitting diodes; lumen loss; silicone phosphor; spectrum intensity; thermal aging; time 500 hour; transmittance loss; Aging; Electronic packaging thermal management; LED lamps; Light emitting diodes; Phosphors; Propagation losses; Refractive index; Semiconductor diodes; Thermal degradation; Thermal engineering; White-light LEDs; aging test; phosphor;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550062