Title :
Tolerating multiple faults with proximate manifestations in FPGA-based critical designs for harsh environments
Author :
Espinosa, Jaime ; De Andrés, David ; Ruiz, Juan Carlos ; Gil, Pedro
Author_Institution :
Fault-Tolerant Syst. Group (GSTF), Univ. Politec. de Valencia (UPV), Valencia, Spain
Abstract :
Field-Programmable Gate Arrays (FPGA) have proven their value over time as final implementation targets. Their singular architecture renders them sensitive to a wide range of faults, specially to those causing multiple and non-simultaneous errors, that can result in silent data corruption and also in structural changes in the hardware implementation. This papers presents and tests an approach to enable the confident use of conventional (low-cost) FPGAs in hostile environments. The design combines spatial and temporal redundancy with partial dynamic reconfiguration to increase the resilience of designs. The goal is to tolerate the occurrence of single and multiple faults, even during the reconfiguration process of FPGAs, while minimizing the impact of the recovery process on system availability. Fault injection techniques are used to experimentally evaluate various features of the approach. Results are very promising and lead us to state that, although many research is still required, the old idea of self-repairing HW designs is closer today.
Keywords :
fault tolerance; field programmable gate arrays; logic design; redundancy; FPGA reconfiguration process; FPGA-based critical designs; data corruption; fault injection techniques; field-programmable gate arrays; multiple fault tolerance; partial dynamic reconfiguration; self-repairing HW designs; self-repairing hardware designs; singular architecture; spatial redundancy; temporal redundancy; Abstracts; Fabrics; Field programmable gate arrays; Random access memory;
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2012 22nd International Conference on
Conference_Location :
Oslo
Print_ISBN :
978-1-4673-2257-7
Electronic_ISBN :
978-1-4673-2255-3
DOI :
10.1109/FPL.2012.6339195