Title :
RTP Optical Pyrometer Temperature Sensing Anomalies on Simox
Author_Institution :
United Technologies Microelectronics Center, Colorado
Keywords :
Optical films; Optical materials; Optical sensors; Oxidation; Rapid thermal processing; Semiconductor films; Silicon; Temperature distribution; Temperature sensors; Thickness measurement;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664787